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Brochure title:
Aberration-Corrected Scanning/Transmission Electron Microscope
Description:
EMSL's aberration-corrected Titan 80-300 scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials.
Clearance number:
PNNL-SA-74054
Contact/Custodian Employee ID:
West, Staci A (staci.west@pnl.gov)
Date published:
September 2010
Number of pages:
2
Background information:
This brochure is in the family of Instruments at EMSL.
Category:
EMSL (William R. Wiley Environmental Molecular Sciences Laboratory)
Key words:
Scanning/Transmission Electron Microscope; EMSL, Environmental Molecular Sciences Laboratory, Microscopy, S/TEM

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