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Brochure title:
Ultra-high Vacuum, Low-temperature Scanning Probe Microscope (UHV LT)
Description:
EMSL’s ultra-high vacuum, low-temperature scanning probe microscope instrument, or UHV LT SPM, is the preeminent system dedicated to surface chemistry and physics at low temperatures down to 5 K. Operating at low temperatures provides high mechanical stability, superior vacuum conditions,and negligible drift for long-term experiments.
Clearance number:
PNNL-SA-88095
Contact/Custodian:
West, Staci A (staci.west@pnnl.gov)
Date published:
May 2012
Number of pages:
2
Background information:
Part of the EMSL family of instruments.
Category:
None
Key words:
EMSL, scanning, probe, mircoscope, microscopy, low-temperature, vaccuum, environmental

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