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Brochure title:
Ultra-High Vacuum, Variable-Temperature Scanning Probe Microscope
Description:
EMSL’s ultra-high vacuum, variable-temperature scanning probe microscope system, or UHV VT SPM, is a state-of-the-art surface science tool comprising multiple complementary probes. It offers atomic-resolution imaging in a temperature range of 50-500 K with a continuous and fast temperature variation and under UHV conditions.
Clearance number:
PNNL-SA-88096
Contact/Custodian:
West, Staci A (staci.west@pnnl.gov)
Date published:
May 2012
Number of pages:
2
Background information:
Part of the EMSL family of instruments.
Category:
None
Key words:
EMSL, environmental, vacuum, variable-temperature, scanning, probe, microscope, microscopy

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