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Brochure title:
EMSL Instrument Series: Spectroscopy and Diffraction: XPS Imaging
Description:
The X-ray photoelectron spectroscopy (XPS) imaging system provides fast, quantitative, real-time parallel imaging with highest resolution spectroscopy at all analysis areas. In addition, the system is equipped with temperature programmed desorption (TPD), ultraviolet photoelectron pectroscopy (UPS), ion scattering spectroscopy (ISS), a cluster/Ar+ ion gun, and a five-axis utomated stage with variable temperature sample environment at the analysis chamber.
Clearance number:
PNNL-SA-75582
Contact/Custodian Employee ID:
West, Staci A (staci.west@pnnl.gov)
Date published:
November 2011
Number of pages:
Background information:
Category:
EMSL (William R. Wiley Environmental Molecular Sciences Laboratory)
Key words:
Spectroscopy and Diffraction: XPS Imaging, X-ray photoelectron, (XPS), TPD, UPS, ISS, cluster/Ar+ ion gun

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