Download a PDF version of this document. (This PDF is for viewing ONLY. For print quality, please order from Duplicating or contact the custodian listed below.)
Brochure title:
|  | EMSL Instrument Series: Spectroscopy and Diffraction: XPS Imaging |
Description:
| | The X-ray photoelectron spectroscopy (XPS) imaging system provides fast, quantitative, real-time parallel imaging with highest resolution spectroscopy at all analysis areas. In addition, the system is equipped with temperature programmed desorption (TPD), ultraviolet photoelectron pectroscopy (UPS), ion scattering spectroscopy (ISS), a cluster/Ar+ ion gun, and a five-axis utomated stage with variable temperature sample environment at the analysis chamber. |
Clearance number:
| | PNNL-SA-75582 |
Contact/Custodian Employee ID:
| | West, Staci A (staci.west@pnnl.gov) |
Date published:
| | November 2011 |
Number of pages:
| | |
Background information:
| | |
Category:
| | EMSL (William R. Wiley Environmental Molecular Sciences Laboratory) | |
Key words:
| | Spectroscopy and Diffraction: XPS Imaging, X-ray photoelectron, (XPS), TPD, UPS, ISS, cluster/Ar+ ion gun |
Use this URL to link directly to this page:
http://readthis.pnl.gov/marketsource/readthis/readthis.nsf/By+Number/B3292?opendocument