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Brochure title:
|  | Aberration-Corrected Scanning/Transmission Electron Microscope |
Description:
| | EMSL's aberration-corrected Titan 80-300 scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, CEOS hexapole spherical aberration corrector for the probe-forming lens, high-angle annular dark field (HAADF) detector, an X-ray spectrometer (EDS), and a high-resolution Gatan Imaging Filter (GIF). The selection of electron energy between 80 kV and 300 kV enables optimized imaging for a variety of samples, including electron beam sensitive materials. |
Clearance number:
| | PNNL-SA-74054 |
Contact/Custodian Employee ID:
| | West, Staci A (staci.west@pnl.gov) |
Date published:
| | September 2010 |
Number of pages:
| | 2 |
Background information:
| | This brochure is in the family of Instruments at EMSL. |
Category:
| | EMSL (William R. Wiley Environmental Molecular Sciences Laboratory) | |
Key words:
| | Scanning/Transmission Electron Microscope; EMSL, Environmental Molecular Sciences Laboratory, Microscopy, S/TEM |
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